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Event-based consensus with relative state measurements

contributor authorWang Yilin , Yu Shuanghe , Long Xiaojun , Jin Lina
date accessioned2020-03-12T23:31:23Z
date available2020-03-12T23:31:23Z
date issued2014
identifier other6896885.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1114710?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleEvent-based consensus with relative state measurements
typeConference Paper
contenttypeMetadata Only
identifier padid8284053
subject keywordsII-VI semiconductors
subject keywordscadmium compounds
subject keywordsdefect states
subject keywordselectron-hole recombination
subject keywordsphotoluminescence
subject keywordssemiconductor thin films
subject keywordssputter deposition
subject keywordstime resolved spectra
subject keywordsCdTe
subject keywordsas-grown sputtered film photoluminescence
subject keywordscadmium telluride deep defects
subject keywordsclose space sublimation
subject keywordsdeep donor acceptor pair recombination
subject keywordsdonor-acceptor separation
subject keywordsmagnetron sputtering
subject keywordsphotoluminescence spectroscopy
subject keywordssteady state photoluminescence
subject keywordstime resolved photoluminescence
subject keywordsAbstracts
subject keywordsEnergy measurement
subject keywordsEner
identifier doi10.1109/PVSC.2014.6925633
journal titleontrol Conference (CCC), 2014 33rd Chinese
filesize151238
citations0


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