Electron emission GaN-AlGaN microwave transit-time diode
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Year
: 2014DOI: 10.1109/ATS.2014.56
Keyword(s): Automatic test pattern generation,Central Processing Unit,Circuit faults,Fault diagnosis,Integrated circuit modeling,Logic gates,Multiplexing,Fault diagnosis,bridging faults,distinguishing multiple types of faults,stuck-at-faults
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Electron emission GaN-AlGaN microwave transit-time diode
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| date accessioned | 2020-03-12T23:28:33Z | |
| date available | 2020-03-12T23:28:33Z | |
| date issued | 2014 | |
| identifier other | 6894771.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1113026?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Electron emission GaN-AlGaN microwave transit-time diode | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8282030 | |
| subject keywords | Automatic test pattern generation | |
| subject keywords | Central Processing Unit | |
| subject keywords | Circuit faults | |
| subject keywords | Fault diagnosis | |
| subject keywords | Integrated circuit modeling | |
| subject keywords | Logic gates | |
| subject keywords | Multiplexing | |
| subject keywords | Fault diagnosis | |
| subject keywords | bridging faults | |
| subject keywords | distinguishing multiple types of faults | |
| subject keywords | stuck-at-faults | |
| identifier doi | 10.1109/ATS.2014.56 | |
| journal title | acuum Nanoelectronics Conference (IVNC), 2014 27th International | |
| filesize | 744029 | |
| citations | 0 | |
| contributor rawauthor | Evtukh, A. , Goncharuk, N. , Litovchenko, V. , Karushkin, N. , Yilmazoglu, O. , Hartnagel, H. , Mimura, H. |