In-situ contact formation for ultra-low contact resistance NiGe using carrier activation enhancement (CAE) techniques for Ge CMOS
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سال
: 2014شناسه الکترونیک: 10.1109/SCAM.2014.17
کلیدواژه(گان): public domain software,software metrics,software reusability,source code (software),LCS-based source code similarity,automatic source code reuse relationship identification,longest common subsequence,open source software projects,pair identification,similarity metric,source file reuse,Educational institutions,History,Libraries,Measurement,Particle separators,Software,White spaces,empirical study,software reuse,source code similarity,version control system
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آمار بازدید
In-situ contact formation for ultra-low contact resistance NiGe using carrier activation enhancement (CAE) techniques for Ge CMOS
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| date accessioned | 2020-03-12T23:28:25Z | |
| date available | 2020-03-12T23:28:25Z | |
| date issued | 2014 | |
| identifier other | 6894409.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1112951?locale-attribute=fa | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | In-situ contact formation for ultra-low contact resistance NiGe using carrier activation enhancement (CAE) techniques for Ge CMOS | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8281934 | |
| subject keywords | public domain software | |
| subject keywords | software metrics | |
| subject keywords | software reusability | |
| subject keywords | source code (software) | |
| subject keywords | LCS-based source code similarity | |
| subject keywords | automatic source code reuse relationship identification | |
| subject keywords | longest common subsequence | |
| subject keywords | open source software projects | |
| subject keywords | pair identification | |
| subject keywords | similarity metric | |
| subject keywords | source file reuse | |
| subject keywords | Educational institutions | |
| subject keywords | History | |
| subject keywords | Libraries | |
| subject keywords | Measurement | |
| subject keywords | Particle separators | |
| subject keywords | Software | |
| subject keywords | White spaces | |
| subject keywords | empirical study | |
| subject keywords | software reuse | |
| subject keywords | source code similarity | |
| subject keywords | version control system | |
| identifier doi | 10.1109/SCAM.2014.17 | |
| journal title | LSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on | |
| filesize | 975750 | |
| citations | 0 | |
| contributor rawauthor | Miyoshi, H. , Ueno, T. , Akiyama, K. , Hirota, Y. , Kaitsuka, T. |