In depth characterization of hole transport in 14nm FD-SOI pMOS devices
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سال
: 2014شناسه الکترونیک: 10.1109/ICRAIE.2014.6909157
کلیدواژه(گان): Carbon dioxide,n Educational institutions,n Lead,n Monitoring,n Object recognition,n Pollution,n Standards,n Arduino,n Gas Sensor,n RFlD,n WS,n loT
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آمار بازدید
In depth characterization of hole transport in 14nm FD-SOI pMOS devices
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| contributor author | Shin, M. | |
| contributor author | Shi, M. | |
| contributor author | Mouis, M. | |
| contributor author | Cros, A. | |
| contributor author | Josse, E. | |
| contributor author | Kim, G.T. | |
| contributor author | Ghibaudo, G. | |
| date accessioned | 2020-03-12T22:53:15Z | |
| date available | 2020-03-12T22:53:15Z | |
| date issued | 2014 | |
| identifier other | 7028215.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1098003?locale-attribute=fa | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | In depth characterization of hole transport in 14nm FD-SOI pMOS devices | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8239018 | |
| subject keywords | Carbon dioxide | |
| subject keywords | n Educational institutions | |
| subject keywords | n Lead | |
| subject keywords | n Monitoring | |
| subject keywords | n Object recognition | |
| subject keywords | n Pollution | |
| subject keywords | n Standards | |
| subject keywords | n Arduino | |
| subject keywords | n Gas Sensor | |
| subject keywords | n RFlD | |
| subject keywords | n WS | |
| subject keywords | n loT | |
| identifier doi | 10.1109/ICRAIE.2014.6909157 | |
| journal title | OI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE | |
| filesize | 800961 | |
| citations | 0 |