Modeling of MOSFETs parameters and volt-ampere characteristics in a wide temperature range for low noise amplifiers design
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Year
: 2014DOI: 10.1109/MWSCAS.2014.6908464
Keyword(s): Algorithm design and analysis,n Benchmark testing,n Clocks,n Integrated circuits,n Three-dimensional displays,n Timing,n Tuning
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Modeling of MOSFETs parameters and volt-ampere characteristics in a wide temperature range for low noise amplifiers design
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| contributor author | Pilipenko, Alexandr M. | |
| contributor author | Biryukov, Vadim N. | |
| date accessioned | 2020-03-12T22:52:30Z | |
| date available | 2020-03-12T22:52:30Z | |
| date issued | 2014 | |
| identifier other | 7027065.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1097558?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Modeling of MOSFETs parameters and volt-ampere characteristics in a wide temperature range for low noise amplifiers design | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8238416 | |
| subject keywords | Algorithm design and analysis | |
| subject keywords | n Benchmark testing | |
| subject keywords | n Clocks | |
| subject keywords | n Integrated circuits | |
| subject keywords | n Three-dimensional displays | |
| subject keywords | n Timing | |
| subject keywords | n Tuning | |
| identifier doi | 10.1109/MWSCAS.2014.6908464 | |
| journal title | esign & Test Symposium (EWDTS), 2014 East-West | |
| filesize | 365084 | |
| citations | 0 |