Author index
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Year
: 2014DOI: 10.1109/MWSCAS.2014.6908434
Keyword(s): 1f noise,n CMOS integrated circuits,n Capacitive sensors,n Capacitors,n Micromechanical devices,n Oscillators,n Sigma Delta modulation,n VCO-ADC,n capacitive MEMS
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| date accessioned | 2020-03-12T22:52:27Z | |
| date available | 2020-03-12T22:52:27Z | |
| date issued | 2014 | |
| identifier other | 7027035.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1097524?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Author index | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8238375 | |
| subject keywords | 1f noise | |
| subject keywords | n CMOS integrated circuits | |
| subject keywords | n Capacitive sensors | |
| subject keywords | n Capacitors | |
| subject keywords | n Micromechanical devices | |
| subject keywords | n Oscillators | |
| subject keywords | n Sigma Delta modulation | |
| subject keywords | n VCO-ADC | |
| subject keywords | n capacitive MEMS | |
| identifier doi | 10.1109/MWSCAS.2014.6908434 | |
| journal title | esign & Test Symposium (EWDTS), 2014 East-West | |
| filesize | 21956 | |
| citations | 0 |