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Preface to IClaNov 2014

Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ISVLSI.2014.80
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1093475
Keyword(s): calibration,n cryptography,n integrated circuit manufacture,n integrated circuit noise,n integrated circuit reliability,n integrated circuit testing,n random number generation,n IC fabrication process,n cryptographic primitives harness randomness,n hardware security primitives,n on-chip calibration,n on-chip noise,n physical unclonable functions,n post-silicon validation,n reliability,n true random number generators,n Circuit faults,n Delays
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    Preface to IClaNov 2014

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date accessioned2020-03-12T22:45:25Z
date available2020-03-12T22:45:25Z
date issued2014
identifier other7022561.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1093475?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titlePreface to IClaNov 2014
typeConference Paper
contenttypeMetadata Only
identifier padid8232905
subject keywordscalibration
subject keywordsn cryptography
subject keywordsn integrated circuit manufacture
subject keywordsn integrated circuit noise
subject keywordsn integrated circuit reliability
subject keywordsn integrated circuit testing
subject keywordsn random number generation
subject keywordsn IC fabrication process
subject keywordsn cryptographic primitives harness randomness
subject keywordsn hardware security primitives
subject keywordsn on-chip calibration
subject keywordsn on-chip noise
subject keywordsn physical unclonable functions
subject keywordsn post-silicon validation
subject keywordsn reliability
subject keywordsn true random number generators
subject keywordsn Circuit faults
subject keywordsn Delays
identifier doi10.1109/ISVLSI.2014.80
journal titleata Mining Workshop (ICDMW), 2014 IEEE International Conference on
filesize130056
citations0
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