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Project based learning for a course on advanced microcontroller: Experiment and results: A case study from BMS College of Engineering, Bangalore, India

Author:
Mekali, H.V.
,
Patil, P.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/CCECE.2014.6901077
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1091540
Keyword(s): AWGN,n Bayes methods,n Gaussian distribution,n image denoising,n maximum likelihood estimation,n Bayesian maximum a posteriori estimator,n additive white Gaussian noise,n contourlet domain image denoising,n moment-based technique,n noise-free coefficient estimation,n noise-free images,n normal inverse gaussian distribution,n signal-to-noise ratio,n Bayes methods,n Gaussian distribution,n Image denoising,n Noise,n Noise measurement,n Noise red
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    Project based learning for a course on advanced microcontroller: Experiment and results: A case study from BMS College of Engineering, Bangalore, India

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contributor authorMekali, H.V.
contributor authorPatil, P.
date accessioned2020-03-12T22:41:49Z
date available2020-03-12T22:41:49Z
date issued2014
identifier other7020255.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1091540
formatgeneral
languageEnglish
publisherIEEE
titleProject based learning for a course on advanced microcontroller: Experiment and results: A case study from BMS College of Engineering, Bangalore, India
typeConference Paper
contenttypeMetadata Only
identifier padid8230385
subject keywordsAWGN
subject keywordsn Bayes methods
subject keywordsn Gaussian distribution
subject keywordsn image denoising
subject keywordsn maximum likelihood estimation
subject keywordsn Bayesian maximum a posteriori estimator
subject keywordsn additive white Gaussian noise
subject keywordsn contourlet domain image denoising
subject keywordsn moment-based technique
subject keywordsn noise-free coefficient estimation
subject keywordsn noise-free images
subject keywordsn normal inverse gaussian distribution
subject keywordsn signal-to-noise ratio
subject keywordsn Bayes methods
subject keywordsn Gaussian distribution
subject keywordsn Image denoising
subject keywordsn Noise
subject keywordsn Noise measurement
subject keywordsn Noise red
identifier doi10.1109/CCECE.2014.6901077
journal titleOOC, Innovation and Technology in Education (MITE), 2014 IEEE International Conference on
filesize119933
citations0
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