Assessing representation techniques of programs supported by GreedEx
ناشر:
سال
: 2014شناسه الکترونیک: 10.1109/IPFA.2014.6898163
کلیدواژه(گان): atomic force microscopy,n buried layers,n failure analysis,n semiconductor technology,n silicon-on-insulator,n SOI wafer,n buried oxide layer,n conductive atomic force microscopy,n die level failure analysis,n local defect isolation,n scanning capacitance microscopy,n silicon on insulator wafer,n Capacitance,n Failure analysis,n Layout,n Microscopy,n Probes,n Silicon,n Silicon-on-insulator
کالکشن
:
-
آمار بازدید
Assessing representation techniques of programs supported by GreedEx
Show full item record
| contributor author | Molina, A.I. | |
| contributor author | Paredes, M. | |
| contributor author | Redondo, M.A. | |
| contributor author | Velazquez, A. | |
| date accessioned | 2020-03-12T22:38:26Z | |
| date available | 2020-03-12T22:38:26Z | |
| date issued | 2014 | |
| identifier other | 7017704.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1089632 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Assessing representation techniques of programs supported by GreedEx | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8227889 | |
| subject keywords | atomic force microscopy | |
| subject keywords | n buried layers | |
| subject keywords | n failure analysis | |
| subject keywords | n semiconductor technology | |
| subject keywords | n silicon-on-insulator | |
| subject keywords | n SOI wafer | |
| subject keywords | n buried oxide layer | |
| subject keywords | n conductive atomic force microscopy | |
| subject keywords | n die level failure analysis | |
| subject keywords | n local defect isolation | |
| subject keywords | n scanning capacitance microscopy | |
| subject keywords | n silicon on insulator wafer | |
| subject keywords | n Capacitance | |
| subject keywords | n Failure analysis | |
| subject keywords | n Layout | |
| subject keywords | n Microscopy | |
| subject keywords | n Probes | |
| subject keywords | n Silicon | |
| subject keywords | n Silicon-on-insulator | |
| identifier doi | 10.1109/IPFA.2014.6898163 | |
| journal title | omputers in Education (SIIE), 2014 International Symposium on | |
| filesize | 463760 | |
| citations | 0 |