Conference Committees
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Year
: 2014DOI: 10.1109/IPFA.2014.6898152
Keyword(s): acoustic transducers,n failure analysis,n insulated gate bipolar transistors,n IGBT modules,n cost effective acoustic scanning,n failure analysis,n inverted scan transducer mount technique,n Acoustics,n Ceramics,n Failure analysis,n Insulated gate bipolar transistors,n Thickness measurement,n Transducers,n Ultrasonic imaging
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Conference Committees
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| date accessioned | 2020-03-12T22:38:24Z | |
| date available | 2020-03-12T22:38:24Z | |
| date issued | 2014 | |
| identifier other | 7017693.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1089621?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Conference Committees | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8227874 | |
| subject keywords | acoustic transducers | |
| subject keywords | n failure analysis | |
| subject keywords | n insulated gate bipolar transistors | |
| subject keywords | n IGBT modules | |
| subject keywords | n cost effective acoustic scanning | |
| subject keywords | n failure analysis | |
| subject keywords | n inverted scan transducer mount technique | |
| subject keywords | n Acoustics | |
| subject keywords | n Ceramics | |
| subject keywords | n Failure analysis | |
| subject keywords | n Insulated gate bipolar transistors | |
| subject keywords | n Thickness measurement | |
| subject keywords | n Transducers | |
| subject keywords | n Ultrasonic imaging | |
| identifier doi | 10.1109/IPFA.2014.6898152 | |
| journal title | omputers in Education (SIIE), 2014 International Symposium on | |
| filesize | 148542 | |
| citations | 0 |