•  English
    • Persian
    • English
  •   Login
  • Ferdowsi University of Mashhad
  • |
  • Information Center and Central Library
    • Persian
    • English
  • Home
  • Source Types
    • Journal Paper
    • Ebook
    • Conference Paper
    • Standard
    • Protocol
    • Thesis
  • Use Help
View Item 
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  • All Fields
  • Title
  • Author
  • Year
  • Publisher
  • Subject
  • Publication Title
  • ISSN
  • DOI
  • ISBN
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

Time-variant chemical plume tracing inspired by the silk moth

Author:
Jouh Yeong Chew
,
Shunsuke, S.
,
Kurabayashi, D.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/IPFA.2014.6898144
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1089612
Keyword(s): focused ion beam technology,n gallium,n integrated circuit manufacture,n integrated circuit reliability,n ion beams,n sputter etching,n xenon,n Ga,n advanced process technologies,n beam sensitive materials,n focused ion beam technology,n ion beams,n localized FIB delayering,n Chemistry,n Copper,n Dielectrics,n Failure analysis,n Materials,n Milling
Collections :
  • Latin Articles
  • Show Full MetaData Hide Full MetaData
  • Statistics

    Time-variant chemical plume tracing inspired by the silk moth

Show full item record

contributor authorJouh Yeong Chew
contributor authorShunsuke, S.
contributor authorKurabayashi, D.
date accessioned2020-03-12T22:38:24Z
date available2020-03-12T22:38:24Z
date issued2014
identifier other7017684.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1089612?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleTime-variant chemical plume tracing inspired by the silk moth
typeConference Paper
contenttypeMetadata Only
identifier padid8227864
subject keywordsfocused ion beam technology
subject keywordsn gallium
subject keywordsn integrated circuit manufacture
subject keywordsn integrated circuit reliability
subject keywordsn ion beams
subject keywordsn sputter etching
subject keywordsn xenon
subject keywordsn Ga
subject keywordsn advanced process technologies
subject keywordsn beam sensitive materials
subject keywordsn focused ion beam technology
subject keywordsn ion beams
subject keywordsn localized FIB delayering
subject keywordsn Chemistry
subject keywordsn Copper
subject keywordsn Dielectrics
subject keywordsn Failure analysis
subject keywordsn Materials
subject keywordsn Milling
identifier doi10.1109/IPFA.2014.6898144
journal titleafety, Security, and Rescue Robotics (SSRR), 2014 IEEE International Symposium on
filesize502740
citations0
  • About Us
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
DSpace software copyright © 2019-2022  DuraSpace