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Development and field testing of UAV-based sampling devices for obtaining volcanic products

Author:
Yajima, R.
,
Nagatani, K.
,
Yoshida, K.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/IPFA.2014.6898140
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1089608
Keyword(s): MOSFET,n X-ray chemical analysis,n failure analysis,n molybdenum,n moulding,n semiconductor device reliability,n zinc,n EDX,n TIVA,n Zn-Mo,n failure analysis,n gate-source short,n molding compound,n nonpassivated MOSFET device,n particle defect,n Circuit faults,n Compounds,n Failure analysis,n Logic gates,n Optical imaging,n Zinc
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    Development and field testing of UAV-based sampling devices for obtaining volcanic products

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contributor authorYajima, R.
contributor authorNagatani, K.
contributor authorYoshida, K.
date accessioned2020-03-12T22:38:23Z
date available2020-03-12T22:38:23Z
date issued2014
identifier other7017680.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1089608
formatgeneral
languageEnglish
publisherIEEE
titleDevelopment and field testing of UAV-based sampling devices for obtaining volcanic products
typeConference Paper
contenttypeMetadata Only
identifier padid8227859
subject keywordsMOSFET
subject keywordsn X-ray chemical analysis
subject keywordsn failure analysis
subject keywordsn molybdenum
subject keywordsn moulding
subject keywordsn semiconductor device reliability
subject keywordsn zinc
subject keywordsn EDX
subject keywordsn TIVA
subject keywordsn Zn-Mo
subject keywordsn failure analysis
subject keywordsn gate-source short
subject keywordsn molding compound
subject keywordsn nonpassivated MOSFET device
subject keywordsn particle defect
subject keywordsn Circuit faults
subject keywordsn Compounds
subject keywordsn Failure analysis
subject keywordsn Logic gates
subject keywordsn Optical imaging
subject keywordsn Zinc
identifier doi10.1109/IPFA.2014.6898140
journal titleafety, Security, and Rescue Robotics (SSRR), 2014 IEEE International Symposium on
filesize1836873
citations0
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