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A nonparallel hexrotor UAV with faster response to disturbances for precision position keeping

Author:
Guangying Jiang
,
Voyles, R.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/IPFA.2014.6898129
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1089597
Keyword(s): focused ion beam technology,n semiconductor technology,n transmission electron microscopy,n advanced semiconductor device analysis,n curtaining effect,n ex situ lift out,n inverted FIB thinning,n inverted sample thinning method,n ultrathin TEM specimens,n Copper,n Films,n Geometry,n Ion beams,n Needles,n Probes,n Silicon
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    A nonparallel hexrotor UAV with faster response to disturbances for precision position keeping

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contributor authorGuangying Jiang
contributor authorVoyles, R.
date accessioned2020-03-12T22:38:22Z
date available2020-03-12T22:38:22Z
date issued2014
identifier other7017669.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1089597?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleA nonparallel hexrotor UAV with faster response to disturbances for precision position keeping
typeConference Paper
contenttypeMetadata Only
identifier padid8227844
subject keywordsfocused ion beam technology
subject keywordsn semiconductor technology
subject keywordsn transmission electron microscopy
subject keywordsn advanced semiconductor device analysis
subject keywordsn curtaining effect
subject keywordsn ex situ lift out
subject keywordsn inverted FIB thinning
subject keywordsn inverted sample thinning method
subject keywordsn ultrathin TEM specimens
subject keywordsn Copper
subject keywordsn Films
subject keywordsn Geometry
subject keywordsn Ion beams
subject keywordsn Needles
subject keywordsn Probes
subject keywordsn Silicon
identifier doi10.1109/IPFA.2014.6898129
journal titleafety, Security, and Rescue Robotics (SSRR), 2014 IEEE International Symposium on
filesize1090603
citations0
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