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An efficient curvelet Bayesian Network based approach for image denoising

Author:
Sharma, P.
,
Jain, R.C.
,
Nagwani, R.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/IVESC.2014.6891983
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1085534
Keyword(s): Raman spectra,n cathodes,n electron field emission,n electron microscopy,n graphene,n C,n Raman spectroscopy,n cathode surface,n electron microscopy,n field emitted electrons,n full energy distribution,n graphene-like structures,n retarding potential method,n Cathodes,n Educational institutions,n Graphene,n Materials,n Metals,n Microscopy,n Optical microscopy
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    An efficient curvelet Bayesian Network based approach for image denoising

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contributor authorSharma, P.
contributor authorJain, R.C.
contributor authorNagwani, R.
date accessioned2020-03-12T22:30:47Z
date available2020-03-12T22:30:47Z
date issued2014
identifier other7012879.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1085534
formatgeneral
languageEnglish
publisherIEEE
titleAn efficient curvelet Bayesian Network based approach for image denoising
typeConference Paper
contenttypeMetadata Only
identifier padid8223004
subject keywordsRaman spectra
subject keywordsn cathodes
subject keywordsn electron field emission
subject keywordsn electron microscopy
subject keywordsn graphene
subject keywordsn C
subject keywordsn Raman spectroscopy
subject keywordsn cathode surface
subject keywordsn electron microscopy
subject keywordsn field emitted electrons
subject keywordsn full energy distribution
subject keywordsn graphene-like structures
subject keywordsn retarding potential method
subject keywordsn Cathodes
subject keywordsn Educational institutions
subject keywordsn Graphene
subject keywordsn Materials
subject keywordsn Metals
subject keywordsn Microscopy
subject keywordsn Optical microscopy
identifier doi10.1109/IVESC.2014.6891983
journal titledvances in Engineering and Technology Research (ICAETR), 2014 International Conference on
filesize369531
citations0
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