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Analysis of the factors influencing the attitude determination accuracy based on orthogonal experiment

contributor authorRao, Jin
contributor authorQiu, Hongzhuan
contributor authorXiong, Kai
date accessioned2020-03-12T22:24:07Z
date available2020-03-12T22:24:07Z
date issued2014
identifier other7007399.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1081762?locale-attribute=en&show=full
formatgeneral
languageEnglish
publisherIEEE
titleAnalysis of the factors influencing the attitude determination accuracy based on orthogonal experiment
typeConference Paper
contenttypeMetadata Only
identifier padid8218287
subject keywordsIII-V semiconductors
subject keywordsn electrical resistivity
subject keywordsn elemental semiconductors
subject keywordsn gallium arsenide
subject keywordsn germanium
subject keywordsn semiconductor diodes
subject keywordsn semiconductor heterojunctions
subject keywordsn solar cells
subject keywordsn surface treatment
subject keywordsn three-dimensional integrated circuits
subject keywordsn wafer bonding
subject keywordsn Ge-GaAs
subject keywordsn I-V characteristic
subject keywordsn TEM observation
subject keywordsn amorphous layer
subject keywordsn bonded interface
subject keywordsn diode-like properties
subject keywordsn directly bonded wafers
subject keywordsn electrical resistance
subject keywordsn high efficiency III-V multijuncti
identifier doi10.1109/LTB-3D.2014.6886189
journal titleuidance, Navigation and Control Conference (CGNCC), 2014 IEEE Chinese
filesize118392
citations0


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