Dynamic coupling and control issues for a lightweight underwater vehicle manipulator system
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: 2014DOI: 10.1145/2593069.2593094
Keyword(s): elemental semiconductors,n embedded systems,n integrated circuit reliability,n microprocessor chips,n radiation hardening (electronics),n silicon,n ASER,n ISA compatible cores,n Si,n adaptive soft error resilience,n area constraints,n dark silicon era,n design-time customization,n embedded processor,n reliability threats,n reliability-heterogeneous processors,n run-time system,n size 45 nm,n soft errors,n system reliability improvements
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Dynamic coupling and control issues for a lightweight underwater vehicle manipulator system
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| contributor author | Barbalata, Corina | |
| contributor author | Dunnigan, Matthew W. | |
| contributor author | Petillot, Yvan | |
| date accessioned | 2020-03-12T22:19:08Z | |
| date available | 2020-03-12T22:19:08Z | |
| date issued | 2014 | |
| identifier other | 7002989.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1078868?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Dynamic coupling and control issues for a lightweight underwater vehicle manipulator system | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8215186 | |
| subject keywords | elemental semiconductors | |
| subject keywords | n embedded systems | |
| subject keywords | n integrated circuit reliability | |
| subject keywords | n microprocessor chips | |
| subject keywords | n radiation hardening (electronics) | |
| subject keywords | n silicon | |
| subject keywords | n ASER | |
| subject keywords | n ISA compatible cores | |
| subject keywords | n Si | |
| subject keywords | n adaptive soft error resilience | |
| subject keywords | n area constraints | |
| subject keywords | n dark silicon era | |
| subject keywords | n design-time customization | |
| subject keywords | n embedded processor | |
| subject keywords | n reliability threats | |
| subject keywords | n reliability-heterogeneous processors | |
| subject keywords | n run-time system | |
| subject keywords | n size 45 nm | |
| subject keywords | n soft errors | |
| subject keywords | n system reliability improvements | |
| identifier doi | 10.1145/2593069.2593094 | |
| journal title | ceans - St. John's, 2014 | |
| filesize | 825250 | |
| citations | 0 |