Automatic diagnosis of astigmatism for Pentacam sagittal maps
Publisher:
Year
: 2014DOI: 10.1109/ISNE.2014.6839366
Keyword(s): delays,n fault diagnosis,n flip-flops,n integrated circuit reliability,n integrated circuit testing,n integrated logic circuits,n logic design,n logic testing,n low-power electronics,n LOC,n LOS,n control signals,n integrated circuit production process,n launch-off-capture test,n launch-off-shift test,n low-power multiple scan test architecture,n multifunction controller design,n multiple scan chains,n scan flip-flop,n test patterns,n t
Collections
:
-
Statistics
Automatic diagnosis of astigmatism for Pentacam sagittal maps
Show full item record
| contributor author | Hasan, Sarah Ali | |
| contributor author | Singh, Mandeep | |
| date accessioned | 2020-03-12T21:58:26Z | |
| date available | 2020-03-12T21:58:26Z | |
| date issued | 2014 | |
| identifier other | 6968539.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1067000 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Automatic diagnosis of astigmatism for Pentacam sagittal maps | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8201405 | |
| subject keywords | delays | |
| subject keywords | n fault diagnosis | |
| subject keywords | n flip-flops | |
| subject keywords | n integrated circuit reliability | |
| subject keywords | n integrated circuit testing | |
| subject keywords | n integrated logic circuits | |
| subject keywords | n logic design | |
| subject keywords | n logic testing | |
| subject keywords | n low-power electronics | |
| subject keywords | n LOC | |
| subject keywords | n LOS | |
| subject keywords | n control signals | |
| subject keywords | n integrated circuit production process | |
| subject keywords | n launch-off-capture test | |
| subject keywords | n launch-off-shift test | |
| subject keywords | n low-power multiple scan test architecture | |
| subject keywords | n multifunction controller design | |
| subject keywords | n multiple scan chains | |
| subject keywords | n scan flip-flop | |
| subject keywords | n test patterns | |
| subject keywords | n t | |
| identifier doi | 10.1109/ISNE.2014.6839366 | |
| journal title | dvances in Computing, Communications and Informatics (ICACCI, 2014 International Conference on | |
| filesize | 2431369 | |
| citations | 0 |