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Session MW: Microw ave and millimeter wave devices, circuits & microsystems

date accessioned2020-03-12T21:56:25Z
date available2020-03-12T21:56:25Z
date issued2014
identifier other6966420.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1065846?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleSession MW: Microw ave and millimeter wave devices, circuits & microsystems
typeConference Paper
contenttypeMetadata Only
identifier padid8199496
subject keywordsaerospace testing
subject keywordsn fault diagnosis
subject keywordsn jet engines
subject keywordsn measurement systems
subject keywordsn pattern clustering
subject keywordsn sensors
subject keywordsn algorithmic correction scheme
subject keywordsn autoadaptive clusterisation algorithm
subject keywordsn calibration
subject keywordsn context variation compensation
subject keywordsn development testing
subject keywordsn fault diagnosis
subject keywordsn fault pattern detection
subject keywordsn frequency response
subject keywordsn harness intermittency failure
subject keywordsn model parameter evolution analysis
subject keywordsn robust monitoring
subject keywordsn sensor measurement
subject keywordsn time dependent model
identifier doi10.1109/AERO.2014.6836193
journal titleemiconductor Conference (CAS), 2014 International
filesize47438
citations0


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