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Finite-size and edge effects on the quantum capacitance of graphene nanoribbon field-effect transistors

Author:
Kliros, George S.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/AERO.2014.6836167
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1065820
Keyword(s): entry, descent and landing (spacecraft),n failure analysis,n risk analysis,n NASA,n accountability,n near-miss events recognition,n organizational messages,n project signifIcance,n risk aversion,n visible failures,n warning signals,n NASA,n Schedules
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    Finite-size and edge effects on the quantum capacitance of graphene nanoribbon field-effect transistors

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contributor authorKliros, George S.
date accessioned2020-03-12T21:56:22Z
date available2020-03-12T21:56:22Z
date issued2014
identifier other6966391.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1065820?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleFinite-size and edge effects on the quantum capacitance of graphene nanoribbon field-effect transistors
typeConference Paper
contenttypeMetadata Only
identifier padid8199453
subject keywordsentry, descent and landing (spacecraft)
subject keywordsn failure analysis
subject keywordsn risk analysis
subject keywordsn NASA
subject keywordsn accountability
subject keywordsn near-miss events recognition
subject keywordsn organizational messages
subject keywordsn project signifIcance
subject keywordsn risk aversion
subject keywordsn visible failures
subject keywordsn warning signals
subject keywordsn NASA
subject keywordsn Schedules
identifier doi10.1109/AERO.2014.6836167
journal titleemiconductor Conference (CAS), 2014 International
filesize813626
citations0
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