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Gigahertz Resonance at gold surface as a tool for ions study under polarized electric fields

Author:
Manole, Claudiu Constantin
,
Pirvu, Cristian
,
Demetrescu, Ioana
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/AERO.2014.6836164
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1065816
Keyword(s): aerospace computing,n object-oriented programming,n program testing,n regression analysis,n Van Allen Probes mission,n automated flight SW testing,n automated flight software test framework,n automated regression,n nonobject-oriented scripting environments,n scripting framework,n space mission ground systems,n Computer architecture,n Manuals,n Probes,n Software,n Space vehicles,n Stress,n Testing
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    Gigahertz Resonance at gold surface as a tool for ions study under polarized electric fields

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contributor authorManole, Claudiu Constantin
contributor authorPirvu, Cristian
contributor authorDemetrescu, Ioana
date accessioned2020-03-12T21:56:21Z
date available2020-03-12T21:56:21Z
date issued2014
identifier other6966388.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1065816?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleGigahertz Resonance at gold surface as a tool for ions study under polarized electric fields
typeConference Paper
contenttypeMetadata Only
identifier padid8199449
subject keywordsaerospace computing
subject keywordsn object-oriented programming
subject keywordsn program testing
subject keywordsn regression analysis
subject keywordsn Van Allen Probes mission
subject keywordsn automated flight SW testing
subject keywordsn automated flight software test framework
subject keywordsn automated regression
subject keywordsn nonobject-oriented scripting environments
subject keywordsn scripting framework
subject keywordsn space mission ground systems
subject keywordsn Computer architecture
subject keywordsn Manuals
subject keywordsn Probes
subject keywordsn Software
subject keywordsn Space vehicles
subject keywordsn Stress
subject keywordsn Testing
identifier doi10.1109/AERO.2014.6836164
journal titleemiconductor Conference (CAS), 2014 International
filesize343429
citations0
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