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Real-time active noise control of multi-tones and MRI acoustic noise in fMRI bore with signal decomposition and parallel hybrid RLS-NLMS adaptive algorithms

Author:
Krishna Vemuri, S.H.
,
Ganguly, A.
,
Panahi, I.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/VLSI-DAT.2014.6834862
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1065077
Keyword(s): integrated circuit modelling,n integrated circuit yield,n thermal stresses,n three-dimensional integrated circuits,n 3D integration,n KOZ overhead,n TSV,n area overhead,n fabrication cost,n keep-out-zone analysis,n thermal stresses,n three-dimensional integrated circuits,n through silicon via,n Fabrication,n Multiplexing,n Silicon,n Stress,n Thermal stresses,n Three-dimensional displays,n Through-silicon vias
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    Real-time active noise control of multi-tones and MRI acoustic noise in fMRI bore with signal decomposition and parallel hybrid RLS-NLMS adaptive algorithms

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contributor authorKrishna Vemuri, S.H.
contributor authorGanguly, A.
contributor authorPanahi, I.
date accessioned2020-03-12T21:55:07Z
date available2020-03-12T21:55:07Z
date issued2014
identifier other6965339.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1065077
formatgeneral
languageEnglish
publisherIEEE
titleReal-time active noise control of multi-tones and MRI acoustic noise in fMRI bore with signal decomposition and parallel hybrid RLS-NLMS adaptive algorithms
typeConference Paper
contenttypeMetadata Only
identifier padid8198346
subject keywordsintegrated circuit modelling
subject keywordsn integrated circuit yield
subject keywordsn thermal stresses
subject keywordsn three-dimensional integrated circuits
subject keywordsn 3D integration
subject keywordsn KOZ overhead
subject keywordsn TSV
subject keywordsn area overhead
subject keywordsn fabrication cost
subject keywordsn keep-out-zone analysis
subject keywordsn thermal stresses
subject keywordsn three-dimensional integrated circuits
subject keywordsn through silicon via
subject keywordsn Fabrication
subject keywordsn Multiplexing
subject keywordsn Silicon
subject keywordsn Stress
subject keywordsn Thermal stresses
subject keywordsn Three-dimensional displays
subject keywordsn Through-silicon vias
identifier doi10.1109/VLSI-DAT.2014.6834862
journal titleircuits and Systems Conference (DCAS), 2014 IEEE Dallas
filesize752333
citations0
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