Recognizing human postures in video sequences using Contour-Point Signature
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Year
: 2014DOI: 10.1109/IITC.2014.6831840
Keyword(s): copper,n foundries,n integrated circuit interconnections,n integrated circuit yield,n three-dimensional integrated circuits,n 2.5D TSV technology,n Cu,n die assembly levels,n foundry TSV integration,n inline defectivity,n integrated circuit manufacturing,n interposer warpage,n oxide liner isolation defects,n stress induced failures,n wafer warpage,n warpage control,n yield projection,n Foundries,n Manufacturing,n Monitoring,n Redundancy
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Recognizing human postures in video sequences using Contour-Point Signature
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| contributor author | Gaona, G. | |
| contributor author | Perez, J. | |
| contributor author | Villamayor-Venialbo, W. | |
| contributor author | Schaerer, C.E. | |
| date accessioned | 2020-03-12T21:54:49Z | |
| date available | 2020-03-12T21:54:49Z | |
| date issued | 2014 | |
| identifier other | 6965099.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1064909?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Recognizing human postures in video sequences using Contour-Point Signature | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8198099 | |
| subject keywords | copper | |
| subject keywords | n foundries | |
| subject keywords | n integrated circuit interconnections | |
| subject keywords | n integrated circuit yield | |
| subject keywords | n three-dimensional integrated circuits | |
| subject keywords | n 2.5D TSV technology | |
| subject keywords | n Cu | |
| subject keywords | n die assembly levels | |
| subject keywords | n foundry TSV integration | |
| subject keywords | n inline defectivity | |
| subject keywords | n integrated circuit manufacturing | |
| subject keywords | n interposer warpage | |
| subject keywords | n oxide liner isolation defects | |
| subject keywords | n stress induced failures | |
| subject keywords | n wafer warpage | |
| subject keywords | n warpage control | |
| subject keywords | n yield projection | |
| subject keywords | n Foundries | |
| subject keywords | n Manufacturing | |
| subject keywords | n Monitoring | |
| subject keywords | n Redundancy | |
| identifier doi | 10.1109/IITC.2014.6831840 | |
| journal title | omputing Conference (CLEI), 2014 XL Latin American | |
| filesize | 877779 | |
| citations | 0 |