iCOP: Automatically Identifying New Child Abuse Media in P2P Networks
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: 2014DOI: 10.1109/PEOCO.2014.6814425
Keyword(s): Gaussian distribution,n MOS integrated circuits,n crystal defects,n electron traps,n exponential distribution,n leakage currents,n power semiconductor devices,n silicon compounds,n temperature,n Gaussian distribution,n Sentaurus TCAD simulation software,n SiO<,sub>,2<,/sub>,n bond breaking process,n electron trapping phenomena,n elevated temperature,n exponential distribution,n leakage current,n off-state breakdown degradation,n off-
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iCOP: Automatically Identifying New Child Abuse Media in P2P Networks
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| contributor author | Peersman, Claudia | |
| contributor author | Schulze, Christian | |
| contributor author | Rashid, Awais | |
| contributor author | Brennan, Margaret | |
| contributor author | Fischer, Carl | |
| date accessioned | 2020-03-12T21:45:47Z | |
| date available | 2020-03-12T21:45:47Z | |
| date issued | 2014 | |
| identifier other | 6957295.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1059553?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | iCOP: Automatically Identifying New Child Abuse Media in P2P Networks | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8191116 | |
| subject keywords | Gaussian distribution | |
| subject keywords | n MOS integrated circuits | |
| subject keywords | n crystal defects | |
| subject keywords | n electron traps | |
| subject keywords | n exponential distribution | |
| subject keywords | n leakage currents | |
| subject keywords | n power semiconductor devices | |
| subject keywords | n silicon compounds | |
| subject keywords | n temperature | |
| subject keywords | n Gaussian distribution | |
| subject keywords | n Sentaurus TCAD simulation software | |
| subject keywords | n SiO< | |
| subject keywords | sub> | |
| subject keywords | 2< | |
| subject keywords | /sub> | |
| subject keywords | n bond breaking process | |
| subject keywords | n electron trapping phenomena | |
| subject keywords | n elevated temperature | |
| subject keywords | n exponential distribution | |
| subject keywords | n leakage current | |
| subject keywords | n off-state breakdown degradation | |
| subject keywords | n off- | |
| identifier doi | 10.1109/PEOCO.2014.6814425 | |
| journal title | ecurity and Privacy Workshops (SPW), 2014 IEEE | |
| filesize | 402026 | |
| citations | 0 |