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Concept Maps Construction Based on Student-Problem Chart

Author:
Shieh, Jiann Cherng
,
Yang, Yi Ting
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICCSP.2014.6949897
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1030439
Keyword(s): CMOS memory circuits,SRAM chips,leakage currents,10T transistor models,6T transistor models,8T transistor models,Analog environment Virtuoso cadence,CMOS SRAM cell,CMOS digital integrated circuits,leakage current,leakage power reduction,size 180 nm,size 45 nm,size 90 nm,sleep transistors,write operation,CMOS integrated circuits,Integrated circuit modeling,Load modeling,SRAM cells,Switching circuits,Transistors,6T-SRAM cell,8T and 10T transistor models,Leakage current and
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    Concept Maps Construction Based on Student-Problem Chart

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contributor authorShieh, Jiann Cherng
contributor authorYang, Yi Ting
date accessioned2020-03-12T20:55:15Z
date available2020-03-12T20:55:15Z
date issued2014
identifier other6913317.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1030439?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleConcept Maps Construction Based on Student-Problem Chart
typeConference Paper
contenttypeMetadata Only
identifier padid8155834
subject keywordsCMOS memory circuits
subject keywordsSRAM chips
subject keywordsleakage currents
subject keywords10T transistor models
subject keywords6T transistor models
subject keywords8T transistor models
subject keywordsAnalog environment Virtuoso cadence
subject keywordsCMOS SRAM cell
subject keywordsCMOS digital integrated circuits
subject keywordsleakage current
subject keywordsleakage power reduction
subject keywordssize 180 nm
subject keywordssize 45 nm
subject keywordssize 90 nm
subject keywordssleep transistors
subject keywordswrite operation
subject keywordsCMOS integrated circuits
subject keywordsIntegrated circuit modeling
subject keywordsLoad modeling
subject keywordsSRAM cells
subject keywordsSwitching circuits
subject keywordsTransistors
subject keywords6T-SRAM cell
subject keywords8T and 10T transistor models
subject keywordsLeakage current and
identifier doi10.1109/ICCSP.2014.6949897
journal titledvanced Applied Informatics (IIAIAAI), 2014 IIAI 3rd International Conference on
filesize259563
citations0
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