•  English
    • Persian
    • English
  •   Login
  • Ferdowsi University of Mashhad
  • |
  • Information Center and Central Library
    • Persian
    • English
  • Home
  • Source Types
    • Journal Paper
    • Ebook
    • Conference Paper
    • Standard
    • Protocol
    • Thesis
  • Use Help
View Item 
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  • All Fields
  • Title
  • Author
  • Year
  • Publisher
  • Subject
  • Publication Title
  • ISSN
  • DOI
  • ISBN
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

The phenomenon of “sharp corner” of Electrolyte-Oxide-Semiconductor structure for copper ions detection

Author:
Gao, J.G. , Wang, H. , Ma, P.C. , Wengang Wu
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICNC.2014.6975879
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1027280
Keyword(s): chaos,linear matrix inequalities,nonlinear control systems,robust control,stochastic systems,uncertain systems,LMI approach,exponential decay rate,exponentially lag synchronization,impulsive controller,linear matrix inequalities,linear matrix inequality,robust impulsive lag synchronization,stochastic impulsive systems,stochastic perturbation,uncertain unified chaotic system,Chaotic communication,Control systems,Symmetric matrices,Synchronization,Uncertainty,Vectors,Comparis
Collections :
  • Latin Articles
  • Show Full MetaData Hide Full MetaData
  • Statistics

    The phenomenon of “sharp corner” of Electrolyte-Oxide-Semiconductor structure for copper ions detection

Show full item record

contributor authorGao, J.G. , Wang, H. , Ma, P.C. , Wengang Wu
date accessioned2020-03-12T20:50:13Z
date available2020-03-12T20:50:13Z
date issued2014
identifier other6908821.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1027280?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleThe phenomenon of “sharp corner” of Electrolyte-Oxide-Semiconductor structure for copper ions detection
typeConference Paper
contenttypeMetadata Only
identifier padid8152375
subject keywordschaos
subject keywordslinear matrix inequalities
subject keywordsnonlinear control systems
subject keywordsrobust control
subject keywordsstochastic systems
subject keywordsuncertain systems
subject keywordsLMI approach
subject keywordsexponential decay rate
subject keywordsexponentially lag synchronization
subject keywordsimpulsive controller
subject keywordslinear matrix inequalities
subject keywordslinear matrix inequality
subject keywordsrobust impulsive lag synchronization
subject keywordsstochastic impulsive systems
subject keywordsstochastic perturbation
subject keywordsuncertain unified chaotic system
subject keywordsChaotic communication
subject keywordsControl systems
subject keywordsSymmetric matrices
subject keywordsSynchronization
subject keywordsUncertainty
subject keywordsVectors
subject keywordsComparis
identifier doi10.1109/ICNC.2014.6975879
journal titleano/Micro Engineered and Molecular Systems (NEMS), 2014 9th IEEE International Conference on
filesize637044
citations0
  • About Us
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
DSpace software copyright © 2019-2022  DuraSpace