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Policy Design Based on Risk at Big Data Era: Case Study of Privacy Invasion in South Korea

Author:
Moon, Hyejung , Cho, Hyun Suk , Jeong, Seo Hwa , Park, Jangho
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICACCCT.2014.7019480
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1025731
Keyword(s): MOSFET,MRAM devices,magnetic tunnelling,1-MTJ based STT-MRAM bitcell,DGMOSFET,DIBL,FinFET based STT-MRAM bitcell,HSPICE,SCE,drain-induced barrier lowering,gate-dielectric leakage,read failure,short-channel effect,subthreshold leakage,write failure,FinFETs,MOSFET circuits,Magnetic tunneling,Nanoscale devices,Switches,System-on-chip,FinFET,MRAM,MTJ,read margin,write margin
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    Policy Design Based on Risk at Big Data Era: Case Study of Privacy Invasion in South Korea

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date accessioned2020-03-12T20:47:41Z
date available2020-03-12T20:47:41Z
date issued2014
identifier other6906854.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1025731?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titlePolicy Design Based on Risk at Big Data Era: Case Study of Privacy Invasion in South Korea
typeConference Paper
contenttypeMetadata Only
identifier padid8150739
subject keywordsMOSFET
subject keywordsMRAM devices
subject keywordsmagnetic tunnelling
subject keywords1-MTJ based STT-MRAM bitcell
subject keywordsDGMOSFET
subject keywordsDIBL
subject keywordsFinFET based STT-MRAM bitcell
subject keywordsHSPICE
subject keywordsSCE
subject keywordsdrain-induced barrier lowering
subject keywordsgate-dielectric leakage
subject keywordsread failure
subject keywordsshort-channel effect
subject keywordssubthreshold leakage
subject keywordswrite failure
subject keywordsFinFETs
subject keywordsMOSFET circuits
subject keywordsMagnetic tunneling
subject keywordsNanoscale devices
subject keywordsSwitches
subject keywordsSystem-on-chip
subject keywordsFinFET
subject keywordsMRAM
subject keywordsMTJ
subject keywordsread margin
subject keywordswrite margin
identifier doi10.1109/ICACCCT.2014.7019480
journal titleig Data (BigData Congress), 2014 IEEE International Congress on
filesize554214
citations0
contributor rawauthorMoon, Hyejung , Cho, Hyun Suk , Jeong, Seo Hwa , Park, Jangho
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