E polarized plane wave diffraction by a wide and thick slit
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Year
: 2014DOI: 10.1109/FSKD.2014.6980872
Keyword(s): Computational modeling,Computer vision,Conferences,Feature extraction,Image segmentation,Semantics,Visualization
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E polarized plane wave diffraction by a wide and thick slit
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| contributor author | Hasegawa, H. , Shirai, H. , Sato, R. | |
| date accessioned | 2020-03-12T20:46:37Z | |
| date available | 2020-03-12T20:46:37Z | |
| date issued | 2014 | |
| identifier other | 6905431.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1025073?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | E polarized plane wave diffraction by a wide and thick slit | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8150058 | |
| subject keywords | Computational modeling | |
| subject keywords | Computer vision | |
| subject keywords | Conferences | |
| subject keywords | Feature extraction | |
| subject keywords | Image segmentation | |
| subject keywords | Semantics | |
| subject keywords | Visualization | |
| identifier doi | 10.1109/FSKD.2014.6980872 | |
| journal title | ntennas and Propagation Society International Symposium (APSURSI), 2014 IEEE | |
| filesize | 145562 | |
| citations | 0 |