Committees
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Year
: 2014DOI: 10.1109/ECCE.2014.6953704
Keyword(s): Degradation,Estimation,Junctions,Load modeling,Logic gates,Reliability,Semiconductor device modeling,SiC-devices,device degradation feedback,gate-driver parameters variation,mission profile variation
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| date accessioned | 2020-03-12T20:40:26Z | |
| date available | 2020-03-12T20:40:26Z | |
| date issued | 2014 | |
| identifier other | 6883283.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1021420 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Committees | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8146078 | |
| subject keywords | Degradation | |
| subject keywords | Estimation | |
| subject keywords | Junctions | |
| subject keywords | Load modeling | |
| subject keywords | Logic gates | |
| subject keywords | Reliability | |
| subject keywords | Semiconductor device modeling | |
| subject keywords | SiC-devices | |
| subject keywords | device degradation feedback | |
| subject keywords | gate-driver parameters variation | |
| subject keywords | mission profile variation | |
| identifier doi | 10.1109/ECCE.2014.6953704 | |
| journal title | ommunications (ICC), 2014 IEEE International Conference on | |
| filesize | 83731 | |
| citations | 0 |