Epitaxial CaF<inf>2</inf>/BaF<inf>2</inf>-on-Si layers and electronic properties of the interface with the substrate
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: 2014DOI: 10.1109/DEXA.2014.54
Keyword(s): Accuracy,Indexes,Matrix decomposition,Measurement,Semantics,Silicon,Vectors,clustering,latent semantic analysis
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Epitaxial CaF<inf>2</inf>/BaF<inf>2</inf>-on-Si layers and electronic properties of the interface with the substrate
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| date accessioned | 2020-03-12T20:39:59Z | |
| date available | 2020-03-12T20:39:59Z | |
| date issued | 2014 | |
| identifier other | 6882484.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1021176?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Epitaxial CaF<inf>2</inf>/BaF<inf>2</inf>-on-Si layers and electronic properties of the interface with the substrate | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8145794 | |
| subject keywords | Accuracy | |
| subject keywords | Indexes | |
| subject keywords | Matrix decomposition | |
| subject keywords | Measurement | |
| subject keywords | Semantics | |
| subject keywords | Silicon | |
| subject keywords | Vectors | |
| subject keywords | clustering | |
| subject keywords | latent semantic analysis | |
| identifier doi | 10.1109/DEXA.2014.54 | |
| journal title | icro/Nanotechnologies and Electron Devices (EDM), 2014 15th International Conference of Young Specia | |
| filesize | 1656413 | |
| citations | 0 | |
| contributor rawauthor | Fedosenko, E.V. , Akimov, A.N. , Klimov, A.E. , Shumsky, V.N. , Erkov, V.G. , Suprun, S.P. |