Toward passive RF tomography: Signal processing and experimental validation
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Year
: 2014DOI: 10.1109/ISLC.2014.229
Keyword(s): Diode lasers,Laser beams,Measurement by laser beam,Packaging,Semiconductor lasers,Structural beams,Thermal resistance
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Toward passive RF tomography: Signal processing and experimental validation
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| date accessioned | 2020-03-12T20:32:32Z | |
| date available | 2020-03-12T20:32:32Z | |
| date issued | 2014 | |
| identifier other | 6875713.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1017790 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Toward passive RF tomography: Signal processing and experimental validation | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8141924 | |
| subject keywords | Diode lasers | |
| subject keywords | Laser beams | |
| subject keywords | Measurement by laser beam | |
| subject keywords | Packaging | |
| subject keywords | Semiconductor lasers | |
| subject keywords | Structural beams | |
| subject keywords | Thermal resistance | |
| identifier doi | 10.1109/ISLC.2014.229 | |
| journal title | adar Conference, 2014 IEEE | |
| filesize | 1119035 | |
| citations | 0 | |
| contributor rawauthor | Tran, T.M. , Terzuoli, A.J. , Scalzi, G.J. , Monte, L.L. |