Considerations regarding shielding effectiveness and testing of electromagnetic protected enclosures used in communications security
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: 2014DOI: 10.1109/ICED.2014.7015789
Keyword(s): annealing,drying,electrical conductivity,electrical resistivity,nanofabrication,nanostructured materials,semiconductor thin films,titanium compounds,AFM,TiO<,sub>,2<,/sub>,annealing,atomic force microscopy,drying temperature,electrical conductivity,electrical resistivity,nanostructured film,temperature 500 degC,voltage 10 V,Annealing,Conductivity,Current measurement,Films,Substrates,Thickness measurement,Voltage measurement,IV characteristics,TiO<,inf>,2<
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Considerations regarding shielding effectiveness and testing of electromagnetic protected enclosures used in communications security
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| contributor author | Bindar, V. , Popescu, M. , Vulpe, A. | |
| date accessioned | 2020-03-12T20:22:51Z | |
| date available | 2020-03-12T20:22:51Z | |
| date issued | 2014 | |
| identifier other | 6866733.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1012401?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Considerations regarding shielding effectiveness and testing of electromagnetic protected enclosures used in communications security | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8135209 | |
| subject keywords | annealing | |
| subject keywords | drying | |
| subject keywords | electrical conductivity | |
| subject keywords | electrical resistivity | |
| subject keywords | nanofabrication | |
| subject keywords | nanostructured materials | |
| subject keywords | semiconductor thin films | |
| subject keywords | titanium compounds | |
| subject keywords | AFM | |
| subject keywords | TiO< | |
| subject keywords | sub> | |
| subject keywords | 2< | |
| subject keywords | /sub> | |
| subject keywords | annealing | |
| subject keywords | atomic force microscopy | |
| subject keywords | drying temperature | |
| subject keywords | electrical conductivity | |
| subject keywords | electrical resistivity | |
| subject keywords | nanostructured film | |
| subject keywords | temperature 500 degC | |
| subject keywords | voltage 10 V | |
| subject keywords | Annealing | |
| subject keywords | Conductivity | |
| subject keywords | Current measurement | |
| subject keywords | Films | |
| subject keywords | Substrates | |
| subject keywords | Thickness measurement | |
| subject keywords | Voltage measurement | |
| subject keywords | IV characteristics | |
| subject keywords | TiO< | |
| subject keywords | inf> | |
| subject keywords | 2< | |
| identifier doi | 10.1109/ICED.2014.7015789 | |
| journal title | ommunications (COMM), 2014 10th International Conference on | |
| filesize | 662963 | |
| citations | 0 |