Electrical characterization and reliability analysis of Al<inf>2</inf>O<inf>3</inf>/AlGaN/GaN MISH structure
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Year
: 2014DOI: 10.1109/ICCKE.2014.6993341
Keyword(s): DH-HEMTs,automatic writer recognition,feature extraction,handmade analysis,writer identification
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Electrical characterization and reliability analysis of Al<inf>2</inf>O<inf>3</inf>/AlGaN/GaN MISH structure
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| date accessioned | 2020-03-12T20:17:00Z | |
| date available | 2020-03-12T20:17:00Z | |
| date issued | 2014 | |
| identifier other | 6861129.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1008761?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Electrical characterization and reliability analysis of Al<inf>2</inf>O<inf>3</inf>/AlGaN/GaN MISH structure | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8130689 | |
| subject keywords | DH-HEMTs | |
| subject keywords | automatic writer recognition | |
| subject keywords | feature extraction | |
| subject keywords | handmade analysis | |
| subject keywords | writer identification | |
| identifier doi | 10.1109/ICCKE.2014.6993341 | |
| journal title | eliability Physics Symposium, 2014 IEEE International | |
| filesize | 335741 | |
| citations | 0 | |
| contributor rawauthor | Jiechen Wu , Xiaoxing Lu , Shenglin Ye , Jinhee Park , Streit, D. |