Increased contact resistance of switching contacts during current carrying

: 2014

یو آر آی: http://libsearch.um.ac.ir:80/fum/handle/fum/1005840

کالکشن :

contributor author	Weis, Martin , Johler, Werner
date accessioned	2020-03-12T20:12:23Z
date available	2020-03-12T20:12:23Z
date issued	2014
identifier other	6857138.pdf
identifier uri	http://libsearch.um.ac.ir:80/fum/handle/fum/1005840
format	general
language	English
publisher	IEEE
title	Increased contact resistance of switching contacts during current carrying
type	Conference Paper
contenttype	Metadata Only
identifier padid	8127313
subject keywords	finite element analysis
subject keywords	photoelasticity
subject keywords	stress analysis
subject keywords	three-dimensional integrated circuits
subject keywords	MIPE system
subject keywords	TSV residual stress
subject keywords	finite element method
subject keywords	maximum principal stress
subject keywords	microinfrared photoelasticity system
subject keywords	silicon chip
subject keywords	stress distribution
subject keywords	stress information
subject keywords	Filling
subject keywords	Finite element analysis
subject keywords	Residual stresses
subject keywords	Silicon
subject keywords	Through-silicon vias
subject keywords	Finite element method
subject keywords	Photo-elasticity
subject keywords	Stress
subject keywords	Through Silicon Via (TSV)
identifier doi	10.1109/ICEPT.2014.6922843
journal title	CEC 2014; The 27th International Conference on Electrical Contacts; Proceedings of
filesize	478350
citations	0

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