An improved IWO-FCM data mining algorithm
Author:
Publisher:
Year
: 2014DOI: 10.1109/BCTM.2014.6981295
Keyword(s): Logic gates,Organic semiconductors,Semiconductor device measurement,Substrates,Thin film transistors,Transconductance,Voltage measurement
Collections
:
-
Statistics
An improved IWO-FCM data mining algorithm
Show full item record
| contributor author | Zhao Xiaoqiang , Zhou Jinhu | |
| date accessioned | 2020-03-12T20:07:57Z | |
| date available | 2020-03-12T20:07:57Z | |
| date issued | 2014 | |
| identifier other | 6853068.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1003093?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | An improved IWO-FCM data mining algorithm | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8124260 | |
| subject keywords | Logic gates | |
| subject keywords | Organic semiconductors | |
| subject keywords | Semiconductor device measurement | |
| subject keywords | Substrates | |
| subject keywords | Thin film transistors | |
| subject keywords | Transconductance | |
| subject keywords | Voltage measurement | |
| identifier doi | 10.1109/BCTM.2014.6981295 | |
| journal title | ontrol and Decision Conference (2014 CCDC), The 26th Chinese | |
| filesize | 266003 | |
| citations | 0 |