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نمایش تعداد 1-8 از 8
A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs
ناشر: IEEE
سال: 2014
A Diamond:H/MoO<sub>3</sub> MOSFET
ناشر: IEEE
سال: 2014
A Novel Digital Etch Technique for Deeply Scaled III-V MOSFETs
ناشر: IEEE
سال: 2014
Enhancing p-channel InGaSb QW-FETs via Process-Induced Compressive Uniaxial Strain
ناشر: IEEE
سال: 2014
Single-Event Transient Response of InGaAs MOSFETs
ناشر: IEEE
سال: 2014