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نمایش تعداد 1-4 از 4

Resilience and yield of flip-flops in future CMOS technologies under process variations and aging

نوع: Journal Paper

نویسنده : Werner, Claudia; Backs, Benedikt; Wirnshofer, Martin; Schmitt-Landsiedel, Doris

ناشر: IET

سال: 2014

Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic

نوع: Conference Paper

نویسنده : Breitkreutz, Stephan; Eichwald, Irina; Ziemys, Grazvydas; Schmitt-Landsiedel, Doris; Becherer, Markus

ناشر: IEEE

سال: 2014

Architectural and Circuit Design Techniques for Power Management of Ultra-Low-Power MCU Systems

نوع: Journal Paper

نویسنده : Lueders, Michael; Eversmann, Bjoern; Gerber, Johannes; Huber, Korbinian; Kuhn, Ruediger; Zwerg, Michael; Schmitt-Landsiedel, Doris; Brederlow, Ralf

ناشر: IEEE

سال: 2014

Power efficient digital IC design for a medical application with high reliability requirements

نوع: Conference Paper

نویسنده : Aryan, Nasim Pour; Heidmann, Nils; Wirnshofer, Martin; Hellwege, Nico; Pistor, Jonas; Peters-Drolshagen, Dagmar; Georgakos, Georg; Paul, Steffen; Schmitt-Landsiedel, Doris

ناشر: IEEE

سال: 2014

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Resilience and yield of flip-flops in future CMOS technologies under process variations and aging

Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic

Architectural and Circuit Design Techniques for Power Management of Ultra-Low-Power MCU Systems

Power efficient digital IC design for a medical application with high reliability requirements

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Resilience and yield of flip-flops in future CMOS technologies under process variations and aging

Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic

Architectural and Circuit Design Techniques for Power Management of Ultra-Low-Power MCU Systems

Power efficient digital IC design for a medical application with high reliability requirements