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نمایش تعداد 1-10 از 21

Thermal and Power Management of Integrated Circuits

نوع: Ebook

نویسنده : Arman Vassighi; Manoj Sachdev

ناشر: Springer

سال: 2006

Defect Oriented Testing for CMOS Analog and Digital Circuits

نوع: Ebook

نویسنده : Manoj Sachdev (auth.)

ناشر: Springer US

سال: 1999

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

نوع: Ebook

نویسنده : Andrei Pavlov; Manoj Sachdev

ناشر: Springer

سال: 2008

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Segmented Virtual Ground Architecture for Low-Power Embedded SRAM

نوع: Journal Paper

نویسنده : Mohammad Sharifkhani; Manoj Sachdev

سال: 2007

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Comparative Robustness of CML Phase Detectors for Clock and Data Recovery Circuits

نوع: Journal Paper

نویسنده : David Rennie; Manoj Sachdev

سال: 2007

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ESD Protection Device and Circuit Design for Advanced CMOS Technologies

نوع: Ebook

نویسنده : Oleg Semenov; Hossein Sarbishaei; Manoj Sachdev

ناشر: Springer

سال: 2008

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A fully digital ADC using a new delay element with enhanced linearity

نوع: Conference Paper

نویسنده : Hooman Farkhani; Mohammad Meymandi-Nejad; Manoj Sachdev

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A new linear delay element with self calibration

نوع: Journal Paper

نویسنده : Afshin Seraj; Mohammad Maymandi-Nejad; Manoj Sachdev

سال: 2015

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A new linear delay element with self calibration

نوع: Journal Paper

نویسنده : Afshin Seraj; Mohammad Maymandi-Nejad; Manoj Sachdev

سال: 2015

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition

نوع: Ebook

نویسنده : Manoj Sachdev; Jos� Pineda de Gyvez (auth.); Manoj Sachdev; Jos� Pineda de Gyvez (eds.)

ناشر: Springer US

سال: 2007

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Thermal and Power Management of Integrated Circuits

Defect Oriented Testing for CMOS Analog and Digital Circuits

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Segmented Virtual Ground Architecture for Low-Power Embedded SRAM

Comparative Robustness of CML Phase Detectors for Clock and Data Recovery Circuits

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

A fully digital ADC using a new delay element with enhanced linearity

A new linear delay element with self calibration

A new linear delay element with self calibration

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition

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Thermal and Power Management of Integrated Circuits

Defect Oriented Testing for CMOS Analog and Digital Circuits

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Segmented Virtual Ground Architecture for Low-Power Embedded SRAM

Comparative Robustness of CML Phase Detectors for Clock and Data Recovery Circuits

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

A fully digital ADC using a new delay element with enhanced linearity

A new linear delay element with self calibration

A new linear delay element with self calibration

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition