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نمایش تعداد 1-10 از 13
Effects of the Length of Thru on the Measurement Precision in TRL Technique
ناشر: IEEE
سال: 2014
Editoral: Special Issue on Photonic and RF Communications Systems
ناشر: IET
سال: 2014
Case study of SRAM threshold voltage shift caused by doping defects
ناشر: IEEE
سال: 2014
The Sky's the Limit: Key Technology and Market Trends in Satellite Communications
ناشر: IEEE
سال: 2014
Wide-angle scanning active transmit/receive reflectarray
ناشر: IET
سال: 2014