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نمایش تعداد 1-5 از 5

Spike Anneal Peak Temperature Impact on 1T-DRAM Retention Time

نوع: Journal Paper

نویسنده : Nissimoff, Albert; Martino, Joao Antonio; Aoulaiche, Marc; Veloso, A.; Witters, Liesbeth Johanna; Simoen, Eddy; Claeys, Cor

ناشر: IEEE

سال: 2014

Impact of Electrode Composition and Processing on the Low-Frequency Noise in SrTio<sub>3</sub> MIM Capacitors

نوع: Journal Paper

نویسنده : Giusi, Gino; Aoulaiche, Marc; Swerts, Johan; Popovici, Mihaela; Redolfi, A.; Simoen, Eddy; Jurczak, Malgorzata

ناشر: IEEE

سال: 2014

Endurance of One Transistor Floating Body RAM on UTBOX SOI

نوع: Journal Paper

نویسنده : Aoulaiche, Marc; Bravaix, A.; Simoen, Eddy; Caillat, Christian; Moonju Cho; Witters, L.; Blomme, P.; Fazan, P.; Groeseneken, Guido; Jurczak, Malgorzata

ناشر: IEEE

سال: 2014

Leakage Control in 0.4-nm EOT Ru/SrTiO<sub><italic>x</italic></sub>/Ru Metal-Insulator-Metal Capacitors: Process Implications

نوع: Journal Paper

نویسنده : Swerts, Johan; Popovici, Mihaela; Kaczer, Ben; Aoulaiche, Marc; Redolfi, A.; Clima, S.; Caillat, Christian; Wan Chih Wang; Afanasev, Valeri V.; Jourdan, Nicolas; Olk, Christina; Hody, Hubert; Van Elshocht, S.; Jurczak, Malgorzata

ناشر: IEEE

سال: 2014

A Low-Power HKMG CMOS Platform Compatible With Dram Node 2× and Beyond

نوع: Journal Paper

نویسنده : Ritzenthaler, R.; Schram, T.; Spessot, A.; Caillat, Christian; Aoulaiche, Marc; Moon Ju Cho; Kyoung Bong Noh; Son, Yeongrack; Hoon Joo Na; Kauerauf, T.; Douhard, B.; Nazir, A.; Soon Aik Chew; Milenin, A.P.; Altamirano-Sanchez, E.; Schoofs, Geert; Albert, J.; Sebai, Farid; Vecchio, Emma; Paraschiv, V.; Vandervorst, W.; Sun-Ghil Lee; Collaert, Nadine; Fazan, P.; Horiguchi, Naoto; Thean, Aaron Voon-Yew

ناشر: IEEE

سال: 2014

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Spike Anneal Peak Temperature Impact on 1T-DRAM Retention Time

Impact of Electrode Composition and Processing on the Low-Frequency Noise in SrTio<sub>3</sub> MIM Capacitors

Endurance of One Transistor Floating Body RAM on UTBOX SOI

Leakage Control in 0.4-nm EOT Ru/SrTiO<sub><italic>x</italic></sub>/Ru Metal-Insulator-Metal Capacitors: Process Implications

A Low-Power HKMG CMOS Platform Compatible With Dram Node 2× and Beyond

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Spike Anneal Peak Temperature Impact on 1T-DRAM Retention Time

Impact of Electrode Composition and Processing on the Low-Frequency Noise in SrTio<sub>3</sub> MIM Capacitors

Endurance of One Transistor Floating Body RAM on UTBOX SOI

Leakage Control in 0.4-nm EOT Ru/SrTiO<sub><italic>x</italic></sub>/Ru Metal-Insulator-Metal Capacitors: Process Implications

A Low-Power HKMG CMOS Platform Compatible With Dram Node 2&#x00D7; and Beyond

A Low-Power HKMG CMOS Platform Compatible With Dram Node 2× and Beyond