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RISIn Situ Investigation of Localized Corrosion of Aluminum Alloys in Chloride Solution Using Integrated EC-AFM/SECM Techniques
سال: 2005
خلاصه:
Scanning electrochemical microscopy (SECM) has been integrated with electrochemical atomic force microscopy (EC-AFM), and applied for in situ studies of localized corrosion of Al alloys in NaCl solution. The instrument ...
Laser-Assisted Reduction of Graphene Oxide for Flexible, Large-Area Optoelectronics
ناشر: IEEE
سال: 2014
Cellular and Molecular Mechanisms of Photobiomodulation (Low-Power Laser Therapy)
ناشر: IEEE
سال: 2014
Total Ionizing Dose Retention Capability of Conductive Bridging Random Access Memory
ناشر: IEEE
سال: 2014