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نمایش تعداد 1-10 از 33
Effect of solidification rate on representative impurities distribution in Si Cu alloy
ناشر: Institute of Materials, Minerals and Mining
سال: 2013
Shortest path reduction in a class of uniform fault tolerant networks
ناشر: IEEE
سال: 2014
Fault Detection for Time-Varying Processes
ناشر: IEEE
سال: 2014
Advanced Bulk Defect Passivation for Silicon Solar Cells
ناشر: IEEE
سال: 2014
Enhanced Weighted Round Robin (EWRR) with DVFS Technology in Cloud Energy-Aware
ناشر: IEEE
سال: 2014
BICom 2014 Organizing Committee and Reviewers
ناشر: IEEE
سال: 2014
Bistatic Geosynchronous SAR for land and atmosphere continuous observation
ناشر: IEEE
سال: 2014