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نمایش تعداد 1-10 از 13

Statistical and algebraic analysis of the transfer matrices errors

نوع: Conference Paper

نویسنده : Abdushukurov, D.

ناشر: IEEE

سال: 2014

Litho-Friendly Decomposition Method for Self-Aligned Triple Patterning

نوع: Journal Paper

نویسنده : Mirsaeedi, Minoo; Torres, Alvaro Javier; Anis, Mohab

ناشر: IEEE

سال: 2014

Multi-hop channel modeling at 60 GHz for on-body communications

نوع: Conference Paper

ناشر: IEEE

سال: 2014

How does the shape descriptor measure the perceptual quality of the retargeting image?

نوع: Conference Paper

ناشر: IEEE

سال: 2014

Random Dopant, Line-Edge Roughness, and Gate Workfunction Variability in a Nano InGaAs FinFET

نوع: Journal Paper

نویسنده : Seoane, N.; Indalecio, G.; Comesana, E.; Aldegunde, Manuel; Garcia-Loureiro, Antonio J.; Kalna, Karol

ناشر: IEEE

سال: 2014

A CUDA Implementation of the Spatial TAU-Leaping in Crowded Compartments (STAUCC) Simulator

نوع: Conference Paper

ناشر: IEEE

سال: 2014

Effects of SiO<sub>2</sub> hard masks on si nanophotonic waveguide loss for photonic device integration

نوع: Journal Paper

نویسنده : Ng, Doris Keh Ting; Qian Wang; Kim-Peng Lim; Jing Pu; Kun Tang; Yicheng Lai; Chee-Wei Lee; Seng-Tiong Ho

ناشر: IEEE

سال: 2014

Improving the search performance of SHADE using linear population size reduction

نوع: Conference Paper

نویسنده : Tanabe, R. , Fukunaga, A.S.

ناشر: IEEE

سال: 2014

Epitaxially Defined FinFET: Variability Resistant and High-Performance Technology

نوع: Journal Paper

نویسنده : Mittal, Sparsh; Gupta, Swastik; Nainani, Aneesh; Abraham, Matthew C.; Schuegraf, Klaus; Lodha, Saurabh; Ganguly, Utsav

ناشر: IEEE

سال: 2014

Interplay Between Statistical Variability and Reliability in Contemporary pMOSFETs: Measurements Versus Simulations

نوع: Journal Paper

نویسنده : Hussin, R.; Amoroso, Salvatore Maria; Gerrer, Louis; Kaczer, Ben; Weckx, Pieter; Franco, Jacopo; Vanderheyden, A.; Vanhaeren, D.; Horiguchi, Naoto; Asenov, Asen

ناشر: IEEE

سال: 2014

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Statistical and algebraic analysis of the transfer matrices errors

Litho-Friendly Decomposition Method for Self-Aligned Triple Patterning

Multi-hop channel modeling at 60 GHz for on-body communications

How does the shape descriptor measure the perceptual quality of the retargeting image?

Random Dopant, Line-Edge Roughness, and Gate Workfunction Variability in a Nano InGaAs FinFET

A CUDA Implementation of the Spatial TAU-Leaping in Crowded Compartments (STAUCC) Simulator

Effects of SiO<sub>2</sub> hard masks on si nanophotonic waveguide loss for photonic device integration

Improving the search performance of SHADE using linear population size reduction

Epitaxially Defined FinFET: Variability Resistant and High-Performance Technology

Interplay Between Statistical Variability and Reliability in Contemporary pMOSFETs: Measurements Versus Simulations

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Statistical and algebraic analysis of the transfer matrices errors

Litho-Friendly Decomposition Method for Self-Aligned Triple Patterning

Multi-hop channel modeling at 60 GHz for on-body communications

How does the shape descriptor measure the perceptual quality of the retargeting image?

Random Dopant, Line-Edge Roughness, and Gate Workfunction Variability in a Nano InGaAs FinFET

A CUDA Implementation of the Spatial TAU-Leaping in Crowded Compartments (STAUCC) Simulator

Effects of SiO<sub>2</sub> hard masks on si nanophotonic waveguide loss for photonic device integration

Improving the search performance of SHADE using linear population size reduction

Epitaxially Defined FinFET: Variability Resistant and High-Performance Technology

Interplay Between Statistical Variability and Reliability in Contemporary pMOSFETs: Measurements Versus Simulations