Search

نمایش تعداد 1-10 از 15

Quantitative model verification in VANET based on interval probabilistic timed automata

نوع: Conference Paper

نویسنده : Qiang Li , Xiaoyan Wang , Shufen Liu

ناشر: IEEE

سال: 2014

Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SoI (ETSoI) MOSFETs

نوع: Journal Paper

نویسنده : Zhaoyun Tang; Bo Tang; Lichuan Zhao; Guilei Wang; Jing Xu; Yefeng Xu; Hongli Wang; Dahai Wang; Junfeng Li; Fujiang Lin; Jiang Yan; Chao Zhao; Tianchun Ye

ناشر: IEEE

سال: 2014

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

نوع: Journal Paper

نویسنده : I-Chung Chiu; I-Chun Cheng

ناشر: IEEE

سال: 2014

Realization of an Image-Based XXY Positioning Platform Control

نوع: Conference Paper

ناشر: IEEE

سال: 2014

Energy Consumption of Photo Sharing in Online Social Networks

نوع: Conference Paper

ناشر: IEEE

سال: 2014

Towards an SLA-Based Service Allocation in Multi-cloud Environments

نوع: Conference Paper

نویسنده : Farokhi, S.

ناشر: IEEE

سال: 2014

Achieving security assurance with assertion-based application construction

نوع: Conference Paper

نویسنده : Rubio-Medrano, C.E.; Gail-Joon Ahn; Sohr, K.

ناشر: IEEE

سال: 2014

AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors

نوع: Journal Paper

نویسنده : Raghuraman, Mathangi; Sambandan, Sanjiv

ناشر: IEEE

سال: 2014

Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

نوع: Journal Paper

نویسنده : Geng-Wei Chang; Ting-Chang Chang; Jhe-Ciou Jhu; Tsung-Ming Tsai; Kuan-Chang Chang; Yong-En Syu; Ya-Hsiang Tai; Fu-Yen Jian; Ya-Chi Hung

ناشر: IEEE

سال: 2014

Research on active voltage stability of distribution network based on the bifurcation theory

نوع: Conference Paper

نویسنده : Guo, Quanli; Yuan, Shun; Gu, Cailian; Zhao, Zhigang

ناشر: IEEE

سال: 2014

Search

Quantitative model verification in VANET based on interval probabilistic timed automata

Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SoI (ETSoI) MOSFETs

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

Realization of an Image-Based XXY Positioning Platform Control

Energy Consumption of Photo Sharing in Online Social Networks

Towards an SLA-Based Service Allocation in Multi-cloud Environments

Achieving security assurance with assertion-based application construction

AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors

Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

Research on active voltage stability of distribution network based on the bifurcation theory

نویسنده

ناشر

سال

کلیدواژه

نوع

زبان

نوع محتوا

عنوان ناشر

Search

Filters

Quantitative model verification in VANET based on interval probabilistic timed automata

Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SoI (ETSoI) MOSFETs

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

Realization of an Image-Based XXY Positioning Platform Control

Energy Consumption of Photo Sharing in Online Social Networks

Towards an SLA-Based Service Allocation in Multi-cloud Environments

Achieving security assurance with assertion-based application construction

AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors

Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

Research on active voltage stability of distribution network based on the bifurcation theory