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نمایش تعداد 1-10 از 35
A novel approach to realize built-in-self-test(BIST) enabled UART using VHDL
ناشر: IEEE
سال: 2014
An IT-driven business model design methodology and its evaluation
ناشر: IEEE
سال: 2014
Th SIFT features matching for spherical panoramic images
ناشر: IEEE
سال: 2014