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نمایش تعداد 1-10 از 14
In Situ Investigation of Localized Corrosion of Aluminum Alloys in Chloride Solution Using Integrated EC-AFM/SECM Techniques
سال: 2005
خلاصه:
Scanning electrochemical microscopy (SECM) has been integrated with electrochemical atomic force microscopy (EC-AFM), and applied for in situ studies of localized corrosion of Al alloys in NaCl solution. The instrument ...
Electrochemical macroporous silicon etching with current compensation
ناشر: IET
سال: 2014
Centralized self-optimization of eICIC with varying traffic in LTE-A
ناشر: IEEE
سال: 2014
Fast prediction of radiation from high-speed/high-density connectors
ناشر: IEEE
سال: 2014
Metallic 10 nm Diameter Magnetic Sensors and Large-Scale Ordered Arrays
ناشر: IEEE
سال: 2014