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Now showing items 1-8 of 8

Nanometer-Scale Vertical-Sidewall Reactive Ion Etching of InGaAs for 3-D III-V MOSFETs

Type: Journal Paper

Author : Xin Zhao; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Type: Journal Paper

Author : Wenjie Lu; Guo, Anjin; Vardi, Alon; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

Off-State Leakage Induced by Band-to-Band Tunneling and Floating-Body Bipolar Effect in InGaAs Quantum-Well MOSFETs

Type: Journal Paper

Author : Jianqiang Lin; Antoniadis, Dimitri /A/.; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

A Diamond:H/MoO<sub>3</sub> MOSFET

Type: Journal Paper

Author : Vardi, Alon; Tordjman, Maurice; del Alamo, Jesus /A/.; Kalish, Rafi

Publisher: IEEE

Year: 2014

Impact of Water-Assisted Electrochemical Reactions on the OFF-State Degradation of AlGaN/GaN HEMTs

Type: Journal Paper

Author : Feng Gao; Swee Ching Tan; del Alamo, Jesus /A/.; Thompson, Carl V.; Palacios, T.

Publisher: IEEE

Year: 2014

A Novel Digital Etch Technique for Deeply Scaled III-V MOSFETs

Type: Journal Paper

Author : Jianqiang Lin; Xin Zhao; Antoniadis, Dimitri /A/.; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

Enhancing p-channel InGaSb QW-FETs via Process-Induced Compressive Uniaxial Strain

Type: Journal Paper

Author : Guo, Luke W.; Xia, Li; Bennett, Brian R.; Boos, J. Brad; Ancona, Mario G.; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

Single-Event Transient Response of InGaAs MOSFETs

Type: Journal Paper

Author : Kai Ni; En Xia Zhang; Hooten, N.C.; Bennett, W.G.; McCurdy, Michael W.; Sternberg, A.L.; Schrimpf, R.D.; Reed, R.A.; Fleetwood, D.M.; Alles, Michael L.; Tae-Woo Kim; Jianqiang Lin; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

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Nanometer-Scale Vertical-Sidewall Reactive Ion Etching of InGaAs for 3-D III-V MOSFETs

A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Off-State Leakage Induced by Band-to-Band Tunneling and Floating-Body Bipolar Effect in InGaAs Quantum-Well MOSFETs

A Diamond:H/MoO<sub>3</sub> MOSFET

Impact of Water-Assisted Electrochemical Reactions on the OFF-State Degradation of AlGaN/GaN HEMTs

A Novel Digital Etch Technique for Deeply Scaled III-V MOSFETs

Enhancing p-channel InGaSb QW-FETs via Process-Induced Compressive Uniaxial Strain

Single-Event Transient Response of InGaAs MOSFETs

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Nanometer-Scale Vertical-Sidewall Reactive Ion Etching of InGaAs for 3-D III-V MOSFETs

A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Off-State Leakage Induced by Band-to-Band Tunneling and Floating-Body Bipolar Effect in InGaAs Quantum-Well MOSFETs

A Diamond:H/MoO<sub>3</sub> MOSFET

Impact of Water-Assisted Electrochemical Reactions on the OFF-State Degradation of AlGaN/GaN HEMTs

A Novel Digital Etch Technique for Deeply Scaled III-V MOSFETs

Enhancing p-channel InGaSb QW-FETs via Process-Induced Compressive Uniaxial Strain

Single-Event Transient Response of InGaAs MOSFETs