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Effect of process technology variation on ESD clamp parameters

Type: Conference Paper

Author : Tazzoli, Augusto; Vashchenko, Vladislav; Shibkov, Andrei

Publisher: IEEE

Year: 2014

Modeling of the test-fixture / Horizontal Coupling Plane interaction in system-level ESD test setups

Type: Conference Paper

Author : Tazzoli, Augusto; Malobabic, Slavica; Vashchenko, Vladislav

Publisher: IEEE

Year: 2014

Correlation Between TLP, HMM, and System-Level ESD Pulses for Cu Metallization

Type: Journal Paper

Author : Xi, Yan; Malobabic, Slavica; Vashchenko, Vladislav; Liou, Juin

Publisher: IEEE

Year: 2014

Miscorrelation Between Air Gap Discharge and Human Metal Model Stresses Due to Multi-Finger Turn-On Effect

Type: Journal Paper

Author : Yunfeng Xi; Malobabic, Slavica; Vashchenko, Vladislav; Liou, Juin J.

Publisher: IEEE

Year: 2014

Author

Vashchenko, Vladislav (4)

Malobabic, Slavica (3)

Tazzoli, Augusto (2)

Liou, Juin (1)

Liou, Juin J. (1)

Shibkov, Andrei (1)

Xi, Yan (1)

Yunfeng Xi (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

electrostatic discharge (2)

Electrostatic discharges (2)

ESD stresses (2)

Hidden Markov models (2)

HMM (2)

IEC (2)

air gaps (1)

Back end of line (BEOL) (1)

back-end-of-line metal-line topology (1)

BEOL (1)

Type

Conference Paper (2)

Journal Paper (2)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

Device and Materials Reliability, IEEE Transactions on (2)

lectrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th (2)

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