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    Simulation of carrier-depletion strained SiGe optical modulators with vertical p-n junction 

    Type: Conference Paper
    Author : Kim, Younghyun; Takenaka, Mitsuru; Takagi, Shinichi
    Publisher: IEEE
    Year: 2014

    Strain-Modulated L-Valley Ballistic-Transport in (111) GaAs Ultrathin-Body nMOSFETs 

    Type: Journal Paper
    Author : Alam, Khairul; Takagi, Shinichi; Takenaka, Mitsuru
    Publisher: IEEE
    Year: 2014

    Sb-Doped S/D Ultrathin Body Ge-On Insulator nMOSFET Fabricated by Improved Ge Condensation Process 

    Type: Journal Paper
    Author : Kim, W.-K.; Kuroda, K.; Takenaka, Mitsuru; Takagi, Shinichi
    Publisher: IEEE
    Year: 2014

    Impact of Channel Orientation on Electrical Properties of Ge p- and n-MOSFETs With 1-nm EOT Al<sub>2</sub>O<sub>3</sub>/GeO<sub>x</sub>/Ge Gate-Stacks Fabricated by Plasma Postoxidation 

    Type: Journal Paper
    Author : Rui Zhang; Xiao Yu; Takenaka, Mitsuru; Takagi, Shinichi
    Publisher: IEEE
    Year: 2014

    Physical Origins of High Normal Field Mobility Degradation in Ge p- and n-MOSFETs With GeO<sub><italic>x</italic></sub>/Ge MOS Interfaces Fabricated by Plasma Postoxidation 

    Type: Journal Paper
    Author : Rui Zhang; Xiao Yu; Takenaka, Mitsuru; Takagi, Shinichi
    Publisher: IEEE
    Year: 2014

    Impact of Plasma Postoxidation Temperature on the Electrical Properties of <formula formulatype="inline"> <img src="/images/tex/21365.gif" alt="{\\rm Al}_{2}{\\rm O}_{3}/{\\rm GeO}_{x}/{\\rm Ge}"> </formula> pMOSFETs and nMOSFETs 

    Type: Journal Paper
    Author : Rui Zhang; Ju-Chin Lin; Xiao Yu; Takenaka, Mitsuru; Takagi, Shinichi
    Publisher: IEEE
    Year: 2014

    High Performance Tri-Gate Extremely Thin-Body InAs-On-Insulator MOSFETs With High Short Channel Effect Immunity and <inline-formula> <img src="/images/tex/21665.gif" alt="V_{\\rm th}"> </inline-formula> Tunability 

    Type: Journal Paper
    Author : Sang-Hyeon Kim; Yokoyama, Masafumi; Nakane, Ryosho; Ichikawa, Osamu; Osada, Takenori; Hata, Masaharu; Takenaka, Mitsuru; Takagi, Shinichi
    Publisher: IEEE
    Year: 2014

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