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Design for Testability Support for Launch and Capture Power Reduction in Launch-Off-Shift and Launch-Off-Capture Testing

Type: Journal Paper

Author : Saeed, Samah Mohamed; Sinanoglu, Ozgur

Publisher: IEEE

Year: 2014

AES design space exploration new line for scan attack resiliency

Type: Conference Paper

Author : Ali, Sk Subidh; Sinanoglu, Ozgur; Karri, Ramesh

Publisher: IEEE

Year: 2014

Regaining Trust in VLSI Design: Design-for-Trust Techniques

Type: Journal Paper

Author : Rajendran, Jeyavijayan; Sinanoglu, Ozgur; Karri, Ramesh

Publisher: IEEE

Year: 2014

Test-mode-only scan attack and countermeasure for contemporary scan architectures

Type: Conference Paper

Author : Saeed, Samah Mohamed; Ali, Sk Subidh; Sinanoglu, Ozgur; Karri, Ramesh

Publisher: IEEE

Year: 2014

Author

Sinanoglu, Ozgur (4)

Karri, Ramesh (3)

Ali, Sk Subidh (2)

Saeed, Samah Mohamed (2)

Rajendran, Jeyavijayan (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

n Analytical models (2)

Aircraft (1)

automatic test pattern generation (1)

cryptography (1)

delay fault (1)

design for testability (1)

design for testability support (1)

Design me (1)

Design partitioning (1)

design partitioning (1)

Type

Conference Paper (2)

Journal Paper (2)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

ery Large Scale Integration (VLSI-SoC), 2014 22nd International Conference on (1)

est Conference (ITC), 2014 IEEE International (1)

Proceedings of the IEEE (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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