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Now showing items 1-8 of 8

Assessment of the Impact of Inelastic Tunneling on the Frequency-Depth Conversion from Low-Frequency Noise Spectra

Type: Journal Paper

Author : Simoen, Eddy; Jae Woo Lee; Claeys, Cor

Publisher: IEEE

Year: 2014

Study on the Optimization for Current Spreading Effect of Lateral GaN/InGaN LEDs

Type: Journal Paper

Author : Chi-kang Li; Rosmeulen, M.; Simoen, Eddy; Yuh-Renn Wu

Publisher: IEEE

Year: 2014

Spike Anneal Peak Temperature Impact on 1T-DRAM Retention Time

Type: Journal Paper

Author : Nissimoff, Albert; Martino, Joao Antonio; Aoulaiche, Marc; Veloso, A.; Witters, Liesbeth Johanna; Simoen, Eddy; Claeys, Cor

Publisher: IEEE

Year: 2014

Impact of Electrode Composition and Processing on the Low-Frequency Noise in SrTio<sub>3</sub> MIM Capacitors

Type: Journal Paper

Author : Giusi, Gino; Aoulaiche, Marc; Swerts, Johan; Popovici, Mihaela; Redolfi, A.; Simoen, Eddy; Jurczak, Malgorzata

Publisher: IEEE

Year: 2014

Border Traps in InGaAs nMOSFETs Assessed by Low-Frequency Noise

Type: Journal Paper

Author : Scarpino, Mercedes; Gupta, Swastik; Lin, Dongyang; Alian, A.; Crupi, Felice; Collaert, Nadine; Thean, A.; Simoen, Eddy

Publisher: IEEE

Year: 2014

Endurance of One Transistor Floating Body RAM on UTBOX SOI

Type: Journal Paper

Author : Aoulaiche, Marc; Bravaix, A.; Simoen, Eddy; Caillat, Christian; Moonju Cho; Witters, L.; Blomme, P.; Fazan, P.; Groeseneken, Guido; Jurczak, Malgorzata

Publisher: IEEE

Year: 2014

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

Type: Journal Paper

Author : Qian Wu; Bayerl, A.; Porti, M.; Martin-Martinez, J.; Lanza, Mario; Rodriguez, Roberto; Velayudhan, V.; Nafria, M.; Aymerich, X.; Bargallo Gonzalez, Mireia; Simoen, Eddy

Publisher: IEEE

Year: 2014

Geometry Dependence of Total-Dose Effects in Bulk FinFETs

Type: Journal Paper

Author : Chatterjee, I.; Zhang, E.X.; Bhuva, B.L.; Reed, R.A.; Alles, Michael L.; Mahatme, N.N.; Ball, D.R.; Schrimpf, R.D.; Fleetwood, D.M.; Linten, D.; Simoen, Eddy; Mitard, J.; Claeys, Cor

Publisher: IEEE

Year: 2014

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Assessment of the Impact of Inelastic Tunneling on the Frequency-Depth Conversion from Low-Frequency Noise Spectra

Study on the Optimization for Current Spreading Effect of Lateral GaN/InGaN LEDs

Spike Anneal Peak Temperature Impact on 1T-DRAM Retention Time

Impact of Electrode Composition and Processing on the Low-Frequency Noise in SrTio<sub>3</sub> MIM Capacitors

Border Traps in InGaAs nMOSFETs Assessed by Low-Frequency Noise

Endurance of One Transistor Floating Body RAM on UTBOX SOI

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

Geometry Dependence of Total-Dose Effects in Bulk FinFETs

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Assessment of the Impact of Inelastic Tunneling on the Frequency-Depth Conversion from Low-Frequency Noise Spectra

Study on the Optimization for Current Spreading Effect of Lateral GaN/InGaN LEDs

Spike Anneal Peak Temperature Impact on 1T-DRAM Retention Time

Impact of Electrode Composition and Processing on the Low-Frequency Noise in SrTio<sub>3</sub> MIM Capacitors

Border Traps in InGaAs nMOSFETs Assessed by Low-Frequency Noise

Endurance of One Transistor Floating Body RAM on UTBOX SOI

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

Geometry Dependence of Total-Dose Effects in Bulk FinFETs